Professor Ibrahim Abdulhalim is with the Electro-optical Engineering Unit at Ben Gurion University. He worked in academic institutions and companies such as the OCSC in UC at Boulder, the ORC at Southampton University, the Thin Films Center of the University of Western Scotland, in KLA-Tencor in where he was the lead inventor of optical scatterometry for CD and overlay measurements, Nova and GWS Photonics, Published over 200 articles, 2 books, 10 chapters and 15 patents. He is a fellow of IoP and SPIE and an associate editor for the Journal of NanoPhotonics and for the Journal of Imaging. Research interests in LC devices, nanophotonics for biosensing, optical imaging techniques and applications in diagnostics and industrial processes inspection using optics